Cluster Secondary Ion Mass Spectrometry

Author : Christine M. Mahoney

Hardback

Published : Friday 28 June 2013

ISBN : 9780470886052

Price : €125.13

Description

This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors.

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