Defect Recognition and Image Processing in Semiconductors 1997Author :
Hardback
Published : Thursday 1 January 1998
Description
Presents an overview of techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This book addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. It investigates defects in layers and devices.
You may also like ...
by
Paperback
13 Jun 2022
Psychology
€23.39
Extended stock – Dispatch 5-7 days
by
Paperback
16 May 2022
Psychology
€21.05
Extended stock – Dispatch 5-7 days
by
Paperback
09 Aug 2021
Social groups: religious groups and communities
€23.39
Extended stock – Dispatch 5-7 days
by
Hardback
12 Jul 2021
History of religion
€33.92
Extended stock – Dispatch 5-7 days
Reviews