Materials Reliability Issues in Microelectronics: Volume 225Author :
Hardback
Published : Tuesday 22 October 1991
Description
With the increased complexity of modern integrated circuits, it is important that reliability problems be attacked properly with the appropriate tools. This volume recognizes that almost all reliability problems are materials problems, and helps to put 'reliabilty physics' on a firm scientific foundation. Topics include electromigration, stress and packaging, metallization and corrosion.
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