Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxford University, April 1987

Author : A.G. Cullis

Hardback

Published : Thursday 1 October 1987

ISBN : 9780854981786

Price : €222.30

Description

Microscopy of Semiconducting Materials 1987 highlights the progress that is being made in semiconductor microscopy, primarily in electron probe methods as well as in light optical and ion scattering techniques. The book covers the state of the art, with sections on high resolution microscopy, epitaxial layers, quantum wells and superlattices, bulk gallium arsenide and other compounds, properties of dislocations, device silicon and dielectric structures, silicides and contacts, device testing, x-ray techniques, microanalysis, and advanced scanning microscopy techniques.

You may also like ...

Introduction to Complex Analysis

by A.G. Vitushkin,A.G. Vitushkin

Paperback

12 Sep 1997

Complex analysis, complex variables

€52.64

Extended stock – Dispatch 5-7 days

Microscopy of Semiconducting Materials ...

by A.G. Cullis,P.A. Midgley

Hardback

13 Dec 2017

Electrical engineering

€234.00

Extended stock – Dispatch 5-7 days

Microscopy of Semiconducting Materials ...

by A.G. Cullis

Hardback

29 Nov 2017

Electrical engineering

€234.00

Extended stock – Dispatch 5-7 days

Microscopy of Semiconducting Materials ...

by A.G. Cullis

Hardback

01 Oct 1987

Spectrum analysis, spectrochemistry, mass spectrometry

€222.30

Extended stock – Dispatch 5-7 days

Reviews